Non-contact thin film thickness measurement

For non-contact thickness measurements of thin layers and films Optek has developed a special software – MThickness. The software comprises interference fringe separation technique in which the interference fringes of the reflected or transmitted spectra are analyzed for thickness measurement. The software can be used with any OceanOptics spectrometer if OmniDriver is installed. The OmniDriver is a free software package available at OceanOptics. The software can also be used for processing any saved spectra using user defined recipes. The software and the necessary hardware can be obtained from Optek. Please, contact us at info[at]optek.lv for more information.